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Understanding Planetary Surfaces through Spectrophotometric Modeling and Measurements

Wednesday, October 29, 2014

Measuring the geometric distribution of light scattered by a surface is an important tool for understanding surface properties such as albedo and surface roughness. When spectrometers and cameras take multiple images of the surface from different viewing angles and with different illumination conditions, they are providing the required dataset.  In this talk, we will discuss how the Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) is used to determine albedo and surface roughness.  Then we will compare the results with data from the Opportunity Mars Rover.  Whether or not in situ data is available, it is often useful to have laboratory measurements of planetary analogs for comparison.  Therefore we will also talk about a laboratory setup used to determine the distribution of light scattered by planetary analog samples.

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